The Broken Chain Analyzer, Diagnostic Manager NetXY, and DC Field Triage Package from Teseda aim to reduce root-cause resolution and improve RMA (return material authorization) cycle time. The software tools work with Teseda’s V550 and V520 silicon-debug and failure-analysis test systems, as well the company’s Workbench silicon-debug environment.
At line widths of 65 nm and below, scan-chain related issues amount to greater than 30% of overall scan failures. The Broken Chain Analyzer uses existing DFT-based tests to automatically analyze captured tester fail logs and detect all common causes of scan-chain failures-both hard and soft-down to the failing bit location.
The Diagnostic Manager NetXY maps device failures from logical to physical net location in a design to shorten determination of root cause. This latest release includes logic cone and physical scan-chain tracing to address EDA-vendor-independent failure diagnosis.
Automated screening tools included in the DC Field Triage Package target DC-related device failures. The toolset puts device-failure triage into the design and field-support centers, enabling timely and detailed responses to customers’ quality concerns. Since first-level field screening is done in the field, factory failure analysis tasks are offloaded by as much as 40%.
Prices for the Broken Chain Analyzer and Diagnostic Manager NetXY start at $40,000 each. The DC Field Triage Package costs $23,000 for either the V550 or V520.
Source:http://www.tmworld.com/article/520126-Teseda_software_tools_aid_silicon_failure_analysis.php
